Improving Design Reliability by Avoiding Electrical Overstress

As integrated circuit (IC) designs become more complex, they will continue to use multiple voltages, which will increase the risk of EOS. 

In this 5-page white paper you will learn: 

  • How EOS occurs and how it can affect an IC
  • The importance of understanding pin voltages
  • How design technology such as CALIBRE PERC can help prevent EOS


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